Bothell, Washington
United States
19
2023-06-29
The entities that hold a legal rights for patent applications filed by inventor Tobiason Joseph Daniel:
Joseph Daniel Tobiason from Bothell, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Metrology system with position and orientation tracking utilizing light beams
#2 | 2023-06-01Metrology system configured to measure apertures of workpieces
#3 | 2023-02-23Encoder
#4 | 2021-10-28Rotating chromatic range sensor system with calibration object and method
#5 | 2021-10-28Rotating chromatic range sensor system with calibration objects and method
#6 | 2021-06-24Tunable acoustic gradient lens system with reflective configuration and increased power
#7 | 2021-03-11Triangulation sensing system and method with triangulation light extended focus range using variable focus lens
#8 | 2020-10-20Triangulation sensing system and method with triangulation light extended focus range using variable focus lens
#9 | 2019-12-31Method for measuring Z height values of a workpiece surface with a machine vision inspection system
#10 | 2019-08-29Contamination and defect resistant rotary optical encoder configuration including a rotary scale with yawed scale grating bars and structured illumination generating arrangement with a beam deflector configuration
#11 | 2019-01-31CONTAMINATION AND DEFECT RESISTANT ROTARY OPTICAL ENCODER CONFIGURATION FOR PROVIDING DISPLACEMENT SIGNALS
#12 | 2019-01-03Contamination and defect resistant optical encoder configuration including a normal of readhead plane at a non-zero pitch angle relative to measuring axis for providing displacement signals
#13 | 2019-01-03Contamination and defect resistant optical encoder configuration for providing displacement signal having a plurality of spatial phase detectors arranged in a spatial phase sequence along a direction transverse to the measuring axis
#14 | 2019-01-03Contamination and defect resistant optical encoder configuration outputting structured illumination to a scale plane for providing displacement signals
#15 | 2019-01-03Contamination and defect resistant optical encoder configuration including first and second illumination source diffraction gratings arranged in first and second parallel planes for providing displacement signals
#16 | 2018-10-04Surface profiling and imaging system including optical channels providing distance-dependent image offsets
#17 | 2018-10-04Compact coordinate measurement machine configuration with large working volume relative to size
#18 | 2014-09-18Optical displacement encoder having plural scale grating portions with spatial phase offset of scale pitch
#19 | 2013-07-18Illumination portion for an adaptable resolution optical encoder
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