Inventor profile of:

William K. Henson

City:

Peekskill, New York

Country:

United States

Published Applications:

20

Last publication date:

2011-11-10

Top Assignees for applications by William K. Henson

The entities that hold a legal rights for patent applications filed by inventor Henson William K.:

Recent patent applications by Henson William K.

William K. Henson from Peekskill, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2011-11-10
US20110272779A1
Electricity

Efuse containing sige stack

#2 | 2011-06-23
US20110147885A1
Electricity

Formation of improved SOI substrates using bulk semiconductor wafers

#3 | 2010-01-21
US20100013024A1
Electricity

High performance stress-enhance MOSFET and method of manufacture

#4 | 2009-02-12
US20090039461A1
Electricity

Formation of improved SOI substrates using bulk semiconductor wafers

#5 | 2008-08-14
US20080191281A1
Electricity

Stressed SOI FET having tensile and compressive device regions

#6 | 2008-07-17
US20080169529A1
Electricity

eFuse containing SiGe stack

#7 | 2008-07-17
US20080169508A1
Electricity

Method of forming stressed SOI FET having doped glass box layer using sacrificial stressed layer

#8 | 2008-06-26
US20080150033A1
Electricity

Scalable strained FET device and method of fabricating the same

#9 | 2008-03-06
US20080054357A1
Electricity

Semiconductor structure with enhanced performance using a simplified dual stress liner configuration

#10 | 2008-02-28
US20080050863A1
Electricity

SEMICONDUCTOR STRUCTURE INCLUDING MULTIPLE STRESSED LAYERS

#11 | 2008-01-31
US20080023778A1
Electricity

Fully Silicided Gate Electrodes and Method of Making the Same

#12 | 2007-11-29
US20070275537A1
Electricity

Formation of improved SOI substrates using bulk semiconductor wafers

#13 | 2007-11-20
US11460762
-

Fully silicided gate electrodes and method of making the same

#14 | 2007-11-01
US20070254478A1
Electricity

Silicide gate field effect transistors and methods for fabrication thereof

#15 | 2007-11-01
US20070254423A1
Electricity

High performance stress-enhance MOSFET and method of manufacture

#16 | 2007-11-01
US20070254422A1
Electricity

High performance stress-enhance MOSFET and method of manufacture

#17 | 2007-10-11
US20070235759A1
Electricity

CMOS process with Si gates for nFETs and SiGe gates for pFETs

#18 | 2007-10-04
US20070228458A1
Electricity

Dual metal integration scheme based on full silicidation of the gate electrode

#19 | 2007-09-13
US20070212861A1
Electricity

LASER SURFACE ANNEALING OF ANTIMONY DOPED AMORPHIZED SEMICONDUCTOR REGION

#20 | 2007-05-31
US20070123042A1
Electricity

METHODS TO FORM HETEROGENEOUS SILICIDES/GERMANIDES IN CMOS TECHNOLOGY

InventorID:

3407289 ⎘