Inventor profile of:

Koichi HASHIMOTO

City:

Sendai

Country:

Japan

Published Applications:

15

Last publication date:

2023-06-08

Top Assignees for applications by Koichi HASHIMOTO

The entities that hold a legal rights for patent applications filed by inventor HASHIMOTO Koichi:

Recent patent applications by HASHIMOTO Koichi

Koichi HASHIMOTO from Sendai, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2023-06-08
US20230175840A1
Physics

THREE-DIMENSIONAL SHAPE MEASURING METHOD AND THREE-DIMENSIONAL SHAPE MEASURING APPARATUS

#2 | 2017-11-30
US20170341230A1
Performing operations; transporting

Robot, robot system, control device, and control method

#3 | 2017-02-23
US20170050316A1
Performing operations; transporting

ROBOT

#4 | 2016-09-22
US20160272354A1
Performing operations; transporting

Packing apparatus and packing method

#5 | 2016-02-04
US20160034746A1
Physics

Control system, robot system, and control method

#6 | 2015-11-26
US20150339833A1
Physics

Control apparatus, robot, and control method

#7 | 2015-10-01
US20150273688A1
Performing operations; transporting

Robot

#8 | 2015-09-10
US20150251314A1
Performing operations; transporting

Robot, robot system, control device, and control method

#9 | 2015-08-06
US20150217451A1
Performing operations; transporting

Robot, robot system, control device, and control method

#10 | 2015-04-23
US20150109203A1
Physics

Performing method of device capable of adjusting images according to body motion of user

#11 | 2013-08-01
US20130195345A1
Physics

Inspecting apparatus, robot apparatus, inspecting method, and inspecting program

#12 | 2013-07-18
US20130182903A1
Physics

Robot apparatus and position and orientation detecting method

#13 | 2012-08-16
US20120209429A1
Performing operations; transporting

Robot apparatus, position detecting device, position detecting program, and position detecting method

#14 | 2012-08-09
US20120201448A1
Physics

ROBOTIC DEVICE, INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM

#15 | 2011-10-06
US20110242308A1
Physics

Microscope and a fluorescent observation method using the same

InventorID:

343275 ⎘