Inventor profile of:

Aaron Wallack

City:

Natick, Massachusetts

Country:

United States

Published Applications:

22

Last publication date:

2020-01-16

Top Assignees for applications by Aaron Wallack

The entities that hold a legal rights for patent applications filed by inventor Wallack Aaron:

Recent patent applications by Wallack Aaron

Aaron Wallack from Natick, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2020-01-16
US20200020130A1
Physics

High speed structured light system

#2 | 2018-09-06
US20180253863A1
Physics

High speed structured light system

#3 | 2015-08-06
US20150222820A1
Electricity

Apparatus, systems, and methods for a multi-position image sensor

#4 | 2013-07-18
US20130182948A1
Physics

Method and apparatus for training a probe model based machine vision system

#5 | 2013-06-04
US12249318
-

Method and apparatus for training a probe model based machine vision system

#6 | 2011-12-08
US20110298934A1
Physics

Method and apparatus for human interface to a machine vision system

#7 | 2011-06-07
US10335829
-

Method and apparatus for human interface to a machine vision system

#8 | 2011-03-10
US20110058730A1
Physics

Image preprocessing for probe mark inspection

#9 | 2010-12-02
US20100303337A1
Performing operations; transporting

Methods and apparatus for practical 3D vision system

#10 | 2008-06-19
US20080144917A1
Physics

Method and apparatus for automatic measurement of pad geometry and inspection thereof

#11 | 2007-07-10
US10443580
-

Image preprocessing for probe mark inspection

#12 | 2007-01-30
US10389475
-

Method and apparatus for automatic measurement of pad geometry and inspection thereof

#13 | 2007-01-16
US10705287
-

Fast high-accuracy multi-dimensional pattern inspection

#14 | 2006-08-08
US10705297
-

Fast high-accuracy multi-dimensional pattern inspection

#15 | 2006-06-20
US10705563
-

Fast high-accuracy multi-dimensional pattern inspection

#16 | 2006-06-06
US10705454
-

Fast high-accuracy multi-dimensional pattern inspection

#17 | 2006-05-09
US10705296
-

Fast high-accuracy multi-dimensional pattern inspection

#18 | 2006-01-31
US10705288
-

Fast high-accuracy multi-dimensional pattern inspection

#19 | 2006-01-17
US10032168
-

Probe mark inspection method and apparatus

#20 | 2006-01-10
US10705564
-

Fast high-accuracy multi-dimensional pattern inspection

#21 | 2005-12-13
US10657522
-

Fast high-accuracy multi-dimensional pattern inspection

#22 | 2005-02-01
US10705295
-

Fast high-accuracy multi-dimensional pattern inspection

InventorID:

343339 ⎘