Stephan WAGNER-CONRAD

City:

Jena

Country:

Germany

Published Applications:

Last publication date:

2011-08-25

Top Assignees for applications by Stephan WAGNER-CONRAD

The entities that hold a legal rights for patent applications filed by inventor WAGNER-CONRAD Stephan:

CARL ZEISS MICROSCOPY GMBH 2 Jena, Germany
CARL ZEISS MICROIMAGING GMBH 1 Jena, Germany

Recent patent applications by WAGNER-CONRAD Stephan

Stephan WAGNER-CONRAD from Jena, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2011-08-25

US20110208478A1

Physics

Method for evaluating fluorescence correlation spectroscopy measurement data

#2 | 2010-09-09

US20100225910A1

Physics

Configuration of a laser scanning microscope for raster image correlation spectroscopy measurement and method for conducting and evaluating such a measurement

#3 | 2010-08-26

US20100214297A1

Physics

Method and arrangement for outputting residual errors for a function customized to a set of points

InventorID:

3433702 ⎘