Eika Tsunemi

City:

Kyoto

Country:

Japan

Published Applications:

Last publication date:

2011-10-06

Top Assignees for applications by Eika Tsunemi

The entities that hold a legal rights for patent applications filed by inventor Tsunemi Eika:

Eika Tsunemi from Kyoto, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for processing output of scanning type probe microscope, and scanning type probe microscope

InventorID:

3455225 ⎘