Hideyuki Moribe

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2011-11-17

Top Assignees for applications by Hideyuki Moribe

The entities that hold a legal rights for patent applications filed by inventor Moribe Hideyuki:

Hideyuki Moribe from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Photomask mounting/housing device and resist inspection method and resist inspection apparatus using same

Optical exterior inspection apparatus and method

Defect inspection method of fine structure object and defect inspection apparatus

Photomask mounting/housing device and resist inspection method and resist inspection apparatus using same

Method and apparatus for inspecting a pattern

Optical inspection apparatus and optical inspection method

InventorID:

3476053 ⎘