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Inventor profile of:

Ho Han

City:

Gyeonggi-do

Country:

Korea (South)

Published Applications:

1

Last publication date:

2011-12-01

Recent patent applications by Han Ho

Ho Han from Gyeonggi-do, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2011-12-01

US20110290646A1

WAFER DEFECT ANALYZING APPARATUS, ION ABSTRACTION APPARATUS FOR SAME, AND WAFER DEFECT ANALYZING METHOD USING SAME

InventorID:

3484199 ⎘