Oberkochen
Germany
76
2026-06-11
The entities that hold a legal rights for patent applications filed by inventor Zeidler Dirk:
Dirk Zeidler from Oberkochen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH AN IMPROVED FOCUS SETTING TAKING INTO ACCOUNT AN IMAGE PLANE TILT
#2 | 2026-06-04PARTICLE-OPTICAL ARRANGEMENT, FOR EXAMPLE MULTI-BEAM PARTICLE MICROSCOPE, WITH A MAGNET ARRANGEMENT FOR SEPARATING A PRIMARY AND A SECONDARY PARTICLE-OPTICAL BEAM PATH WITH IMPROVED PERFORMANCE
#3 | 2026-04-23MULTI-BEAM CHARGED PARTICLE MICROSCOPE FOR INSPECTION WITH IMPROVED IMAGE CONTRAST
#4 | 2026-03-19MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE
#5 | 2026-03-12MULTI-BEAM CHARGED PARTICLE MICROSCOPE FOR INSPECTION WITH INCREASED THROUGHPUT
#6 | 2026-01-22HIGH THROUGHPUT MULTI-BEAM CHARGED PARTICLE INSPECTION SYSTEM WITH DYNAMIC CONTROL
#7 | 2025-12-11PARTICLE BEAM SYSTEM
#8 | 2025-12-04MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ADAPTIVE DETECTION SYSTEM
#9 | 2025-11-13MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH A DETECTION UNIT FOR FAST COMPENSATION OF CHARGING EFFECTS
#10 | 2025-11-13METHOD FOR DESIGNING A MULTI-BEAM PARTICLE BEAM SYSTEM HAVING MONOLITHIC PATH TRAJECTORY CORRECTION PLATES, COMPUTER PROGRAM PRODUCT AND MULTI-BEAM PARTICLE BEAM SYSTEM
#11 | 2025-11-06MULTI-BEAM PARTICLE MICROSCOPE WITH IMPROVED MULTI-BEAM GENERATOR FOR FIELD CURVATURE CORRECTION AND MULTI-BEAM GENERATOR
#12 | 2025-11-06FAST CLOSED-LOOP CONTROL OF MULTI-BEAM CHARGED PARTICLE SYSTEM
#13 | 2025-09-25MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH DETECTION SYSTEM FOR FAST CHARGE COMPENSATION
#14 | 2025-09-11MULTI-BEAM PARTICLE MICROSCOPE COMPRISING AN ABERRATION CORRECTION UNIT HAVING GEOMETRY-BASED CORRECTION ELECTRODES, AND METHOD FOR ADJUSTING THE ABERRATION CORRECTION, AND COMPUTER PROGRAM PRODUCT
#15 | 2025-07-24MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ANISOTROPIC FILTERING FOR IMPROVED IMAGE CONTRAST
#16 | 2025-07-17PARTICLE BEAM SYSTEM
#17 | 2025-06-26METHOD FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE, CORPUSCULAR MULTI-BEAM MICROSCOPE FOR VOLTAGE CONTRAST IMAGING AND SEMICONDUCTOR STRUCTURES FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE
#18 | 2025-06-26PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MICROSCOPE, WITH A MAGNET ARRANGEMENT FOR SEPARATING A PRIMARY AND A SECONDARY PARTICLE-OPTICAL BEAM PATH
#19 | 2025-04-24MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH MIRROR FOR FIELD CURVATURE CORRECTION
#20 | 2025-01-02METHOD FOR DETERMINING A DISTORTION-CORRECTED POSITION OF A FEATURE IN AN IMAGE IMAGED WITH A MULTI-BEAM CHARGED PARTICLE MICROSCOPE, CORRESPONDING COMPUTER PROGRAM PRODUCT AND MULTI-BEAM CHARGED PARTICLE MICROSCOPE
#21 | 2024-09-19METHOD FOR OPERATING A MULTI-BEAM PARTICLE BEAM MICROSCOPE
#22 | 2024-07-11MULTI-BEAM PARTICLE BEAM SYSTEM
#23 | 2024-06-27System comprising a multi-beam particle microscope and method for operating the same
#24 | 2024-05-23MULTI-BEAM GENERATING UNIT WITH INCREASED FOCUSING POWER
#25 | 2024-04-25MULTI-BEAM PARTICLE BEAM SYSTEM
#26 | 2024-04-18MULTI-BEAM CHARGED PARTICLE BEAM SYSTEM WITH ANISOTROPIC FILTERING FOR IMPROVED IMAGE CONTRAST
#27 | 2024-03-21DISTORTION OPTIMIZED MULTI-BEAM SCANNING SYSTEM
#28 | 2024-03-07MULTI-BEAM CHARGED PARTICLE SYSTEM AND METHOD OF CONTROLLING THE WORKING DISTANCE IN A MULTI-BEAM CHARGED PARTICLE SYSTEM
#29 | 2023-08-03MULTIPLE PARTICLE BEAM MICROSCOPE AND ASSOCIATED METHOD WITH FAST AUTOFOCUS AROUND AN ADJUSTABLE WORKING DISTANCE
#30 | 2023-07-06Method for operating a multi-beam particle beam microscope
#31 | 2023-03-02PARTICLE BEAM SYSTEM WITH MULTI-SOURCE SYSTEM AND MULTI-BEAM PARTICLE MICROSCOPE
#32 | 2023-02-09HIGH THROUGHPUT MULTI-BEAM CHARGED PARTICLE INSPECTION SYSTEM WITH DYNAMIC CONTROL
#33 | 2023-01-05Method for area-wise inspecting a sample via a multi-beam particle microscope, computer program product and multi-beam particle microscope for semiconductor sample inspection, and its use
#34 | 2022-12-08CERTAIN IMPROVEMENTS OF MULTI-BEAM GENERATING AND MULTI-BEAM DEFLECTING UNITS
#35 | 2022-09-01PARTICLE BEAM SYSTEM INCLUDING A MULTI-BEAM DEFLECTION DEVICE AND A BEAM STOP, METHOD FOR OPERATING THE PARTICLE BEAM SYSTEM AND ASSOCIATED COMPUTER PROGRAM PRODUCT
#36 | 2022-08-11METHOD FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE, CORPUSCULAR MULTI-BEAM MICROSCOPE FOR VOLTAGE CONTRAST IMAGING AND SEMICONDUCTOR STRUCTURES FOR VOLTAGE CONTRAST IMAGING WITH A CORPUSCULAR MULTI-BEAM MICROSCOPE
#37 | 2022-08-04Multiple particle beam microscope and associated method with an improved focus setting taking into account an image plane tilt
#38 | 2022-05-05Particle beam system and the use thereof for flexibly setting the current intensity of individual particle beams
#39 | 2022-04-07Charged particle beam system
#40 | 2022-03-31Particle beam system for azimuthal deflection of individual particle beams and method for azimuth correction in a particle beam system
#41 | 2021-11-11Method of imaging a 2D sample with a multi-beam particle microscope
#42 | 2021-11-04System comprising a multi-beam particle microscope and method for operating the same
#43 | 2021-10-07Particle beam system and method for the particle-optical examination of an object
#44 | 2021-09-23Method of recording an image using a particle microscope
#45 | 2021-07-15Multi-beam particle beam system and method for operating same
#46 | 2021-07-08Method for operating a multi-beam particle beam microscope
#47 | 2021-07-08Particle beam system for adjusting the current of individual particle beams
#48 | 2021-06-24Method for detector equalization during the imaging of objects with a multi-beam particle microscope
#49 | 2021-05-13Particle beam system
#50 | 2021-02-04System combination of a particle beam system and a light-optical system with collinear beam guidance, and use of the system combination
#51 | 2021-01-07Charged particle beam system and method
#52 | 2020-12-31Charged particle beam system
#53 | 2020-11-26Multi-beam particle microscope
#54 | 2020-11-12Multi-beam charged particle system
#55 | 2020-08-06Multi-beam charged particle system
#56 | 2020-07-30Method of imaging a 3D sample with a multi-beam particle microscope
#57 | 2020-07-02APPARATUS FOR GENERATING A MULTIPLICITY OF PARTICLE BEAMS, AND MULTI-BEAM PARTICLE BEAM SYSTEMS
#58 | 2020-03-26Particle beam system and method for the particle-optical examination of an object
#59 | 2019-11-21Charged particle beam system
#60 | 2019-11-21Charged particle beam system and method
#61 | 2019-04-25Particle beam system and method for the particle-optical examination of an object
#62 | 2019-03-21Particle beam system
#63 | 2018-02-08Particle beam system and method for operating a particle optical unit
#64 | 2017-11-02Particle beam system and method for the particle-optical examination of an object
#65 | 2017-05-11Particle beam system
#66 | 2017-04-27Method for operating a multi-beam particle microscope
#67 | 2016-09-08Methods and devices for charge compensation
#68 | 2016-06-02Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
#69 | 2015-12-10Particle beam system and method for operating a particle optical unit
#70 | 2015-12-03Particle beam system
#71 | 2015-04-02Charged particle multi-beam inspection system and method of operating the same
#72 | 2015-03-26Method of detecting electrons, an electron-detector and an inspection system
#73 | 2015-03-12Particle optical system
#74 | 2013-07-25Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
#75 | 2012-08-09Particle beam system
#76 | 2011-09-22Inspection system
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