Eindhoven
Netherlands
10
2011-04-28
The entities that hold a legal rights for patent applications filed by inventor Wadman Sipke:
Sipke Wadman from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD AND APPARATUS FOR THE OPTICAL CHARACTERIZATION OF SURFACES
#2 | 2011-01-20Apparatus for skin imaging, system for skin analysis
#3 | 2010-08-19Apparatus for observing the surface of a sample
#4 | 2010-08-19Apparatus and method for observing the surface of a sample
#5 | 2010-04-15Apparatus and a method for observing the surface of a sample
#6 | 2009-11-12Optical measurement device
#7 | 2009-07-09Optical measurement device
#8 | 2009-01-01Optical measurement device with reduced contact area
#9 | 2006-07-06Scatterometer and a method for observing a surface
#10 | 2006-03-30Scatterometer and a method for inspecting a surface
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