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Inventor profile of:

Francesco Ziprani

City:

Firenze

Country:

Italy

Published Applications:

1

Last publication date:

2011-09-01

Recent patent applications by Ziprani Francesco

Francesco Ziprani from Firenze, IT has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2011-09-01

US20110210691A1

METHOD, MEASURING ARRANGEMENT AND APPARATUS FOR OPTICALLY MEASURING BY INTERFEROMETRY THE THICKNESS OF AN OBJECT

InventorID:

3566071 ⎘