Hidekazu Mimura

City:

Osaka

Country:

Japan

Published Applications:

Last publication date:

2011-12-15

Top Assignees for applications by Hidekazu Mimura

The entities that hold a legal rights for patent applications filed by inventor Mimura Hidekazu:

Hidekazu Mimura from Osaka, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Method and apparatus of precisely measuring intensity profile of X-ray nanobeam

X-ray condensing method and its device using phase restoration method

High precision posture control method of X-ray mirror

Ultra precision profile measuring method

InventorID:

3577665 ⎘