Inventor profile of:

Jae Woo Ryu

City:

Chesterfield, Missouri

Country:

United States

Published Applications:

15

Last publication date:

2021-11-25

Top Assignees for applications by Jae Woo Ryu

The entities that hold a legal rights for patent applications filed by inventor Ryu Jae Woo:

Recent patent applications by Ryu Jae Woo

Jae Woo Ryu from Chesterfield, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2021-11-25
US20210363658A1
Chemistry; metallurgy

Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method

#2 | 2021-11-25
US20210363657A1
Chemistry; metallurgy

Single crystal silicon ingot having axial uniformity

#3 | 2021-11-04
US20210340691A1
Chemistry; metallurgy

CRYSTAL PULLING SYSTEM AND METHODS FOR PRODUCING MONOCRYSTALLINE INGOTS WITH REDUCED EDGE BAND DEFECTS

#4 | 2021-03-18
US20210079554A1
Chemistry; metallurgy

Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method

#5 | 2021-03-18
US20210079553A1
Chemistry; metallurgy

Single crystal silicon ingot having axial uniformity

#6 | 2021-03-11
US20210071315A1
Chemistry; metallurgy

Methods for forming single crystal silicon ingots with improved resistivity control

#7 | 2019-08-29
US20190267251A1
Electricity

Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield

#8 | 2019-05-09
US20190136408A1
Chemistry; metallurgy

Crystal pulling systems and methods for producing monocrystalline ingots with reduced edge band defects

#9 | 2018-08-23
US20180237938A1
Chemistry; metallurgy

Methods for producing low oxygen silicon ingots

#10 | 2018-06-28
US20180182641A1
Electricity

Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield

#11 | 2018-06-28
US20180179660A1
Chemistry; metallurgy

Methods for forming single crystal silicon ingots with improved resistivity control

#12 | 2018-02-01
US20180030615A1
Chemistry; metallurgy

METHODS FOR PRODUCING SINGLE CRYSTAL SILICON INGOTS WITH REDUCED SEED END OXYGEN

#13 | 2017-04-20
US20170107639A1
Chemistry; metallurgy

Crystal pulling systems and methods for producing monocrystalline ingots with reduced edge band defects

#14 | 2016-04-21
US20160108551A1
Chemistry; metallurgy

Methods for producing low oxygen silicon ingots

#15 | 2013-08-01
US20130192303A1
Physics

QUALITATIVE CRYSTAL DEFECT EVALUATION METHOD

InventorID:

359130 ⎘