Robert B. Gass

Internally controlling and enhancing logic built-in self test in a multiple core microprocessor

Internally controlling and enhancing advanced test and characterization in a multiple core microprocessor

Techniques for performing a Logic Built-In Self-Test in an integrated circuit device

Techniques for logic built-in self-test diagnostics of integrated circuit devices

Automated system and processing for expedient diagnosis of broken shift registers latch chains

Driving values to DC adjusted/untimed nets to identify timing problems

Method for driving values to DC adjusted/untimed nets to identify timing problems

Hamming distance comparison