Daniel Kost

City:

Dresden

Country:

Germany

Published Applications:

Last publication date:

2010-08-05

Top Assignees for applications by Daniel Kost

The entities that hold a legal rights for patent applications filed by inventor Kost Daniel:

Daniel Kost from Dresden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Method and system for semiconductor process control and monitoring by using a data quality metric

Method and system for semiconductor process control and monitoring by using PCA models of reduced size

InventorID:

3650811 ⎘