Michael G. Meyer

City:

Seattle, Washington

Country:

United States

Published Applications:

Last publication date:

2010-12-23

Top Assignees for applications by Michael G. Meyer

The entities that hold a legal rights for patent applications filed by inventor Meyer Michael G.:

Michael G. Meyer from Seattle, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Focal plane tracking for optical microtomography

System and method for detecting poor quality in 3D reconstructions

Pattern noise correction for pseudo projections

Method for image processing and reconstruction of images for optical tomography

Optical tomography of small objects using parallel ray illumination and post-specimen optical magnification

InventorID:

3654083 ⎘