🔗 Permalink

Inventor profile of:

Aritoshi Sugimoto

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2026-05-28

Top Assignees for applications by Aritoshi Sugimoto

The entities that hold a legal rights for patent applications filed by inventor Sugimoto Aritoshi:

HITACHI, LTD. 15 Tokyo, Japan
HITACHI HIGH-TECH CORPORATION 5 Tokyo, Japan
Hitachi ULSI Systems Co., Ltd. 2 Tokyo, Japan
RENESAS TECHNOLOGY CORPORATION 1 Tokyo, Japan
Hitachi ULSI Systems Co., Ltd. 1 Kodaira, Japan

Recent patent applications by Sugimoto Aritoshi

Aritoshi Sugimoto from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-28

US20260149010A1

Electricity

FUEL CELL MODULE AND MANUFACTURING METHOD FOR SAME

#2 | 2024-04-11

US20240120520A1

Electricity

FUEL BATTERY CELL AND MANUFACTURING METHOD THEREFOR

#3 | 2023-04-27

US20230127271A1

Electricity

Fuel Cell and Method for Producing Same

#4 | 2023-01-05

US20230006233A1

Electricity

Fuel Cell and Method for Producing Fuel Cell

#5 | 2022-12-15

US20220399558A1

Electricity

Fuel Battery Cell and Method for Manufacturing Fuel Battery Cell

#6 | 2022-12-08

US20220393215A1

Electricity

Fuel Cell, Fuel Cell System and Method for Producing Fuel Cell

#7 | 2022-12-01

US20220384835A1

Electricity

Fuel Cell Array and Fuel Cell Inspection Method

#8 | 2022-06-09

US20220181658A1

Electricity

Fuel battery cell, fuel battery system, leak detection method

#9 | 2022-03-03

US20220069327A1

Electricity

FUEL BATTERY CELL AND FUEL BATTERY MODULE

#10 | 2021-12-30

US20210408556A1

Electricity

Fuel cell

#11 | 2010-09-30

US20100246933A9

Physics

Pattern inspection method and apparatus

#12 | 2008-12-11

US20080302964A1

Physics

Method and apparatus for inspecting integrated circuit pattern

#13 | 2008-03-13

US20080063257A1

Physics

Pattern inspection method and apparatus

#14 | 2008-03-06

US20080056559A1

Physics

Pattern inspection method and apparatus

#15 | 2007-11-22

US20070269101A1

Physics

Pattern inspection method and apparatus

#16 | 2007-09-04

US9986577

Pattern inspection method and apparatus

#17 | 2007-08-21

US9571938

Method and system for inspecting a pattern

#18 | 2006-11-07

US9986299

Pattern inspection method and apparatus

#19 | 2006-05-25

US20060110667A1

Physics

Method of fabrication of semiconductor integrated circuit device and mask fabrication method

#20 | 2006-04-11

US10379555

Method and apparatus for inspecting integrated circuit pattern

#21 | 2006-03-02

US20060043982A1

Physics

Method and apparatus for inspecting integrated circuit pattern

#22 | 2005-12-08

US20050269511A1

Physics

Probe driving method, and probe apparatus

#23 | 2005-11-29

US10803932

Apparatus for inspecting defects of devices and method of inspecting defects

#24 | 2005-11-01

US10296887

Probe driving method, and probe apparatus

#25 | 2005-05-17

US10269127

Method for test conditions

#26 | 2005-04-21

US20050082476A1

Electricity

Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same

#27 | 2005-02-24

US20050041836A1

Physics

Information media using information of defect in an article

#28 | 2005-01-11

US10269268

Photomask for test wafers

InventorID:

3660466 ⎘