Benjamin Dusser

City:

Saint Etienne

Country:

France

Published Applications:

Last publication date:

2010-10-07

Top Assignees for applications by Benjamin Dusser

The entities that hold a legal rights for patent applications filed by inventor Dusser Benjamin:

ADVANCED TRACK AND TRACE 1 Rueil-Malmaison, France
ADVANCED TRACK & TRACE 1 Rueil-Malmaison Cedex, France

Recent patent applications by Dusser Benjamin

Benjamin Dusser from Saint Etienne, FR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2010-10-07

US20100253760A1

Physics

Method and device for marking a surface using controlled periodic nanostructures

InventorID:

3665705 ⎘