You MIMURA

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2010-11-11

Top Assignees for applications by You MIMURA

The entities that hold a legal rights for patent applications filed by inventor MIMURA You:

You MIMURA from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Wavelength determining apparatus, method and program for thin film thickness monitoring light

Wavelength determining apparatus, method and program for thin film thickness monitoring light

InventorID:

3689166 ⎘