Inventor profile of:

SAMEER H JAIN

City:

Beacon, New York

Country:

United States

Published Applications:

18

Last publication date:

2019-07-04

Top Assignees for applications by SAMEER H JAIN

The entities that hold a legal rights for patent applications filed by inventor JAIN SAMEER H:

Recent patent applications by JAIN SAMEER H

SAMEER H JAIN from Beacon, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2019-07-04
US20190206866A1
Electricity

Third type of metal gate stack for CMOS devices

#2 | 2017-08-10
US20170229458A1
Electricity

Third type of metal gate stack for CMOS devices

#3 | 2016-11-10
US20160329251A1
Electricity

Unidirectional spacer in trench silicide

#4 | 2016-09-29
US20160284598A1
Electricity

Fin end spacer for preventing merger of raised active regions

#5 | 2016-02-04
US20160035876A1
Electricity

Fin end spacer for preventing merger of raised active regions

#6 | 2016-02-04
US20160035875A1
Electricity

Fin end spacer for preventing merger of raised active regions

#7 | 2016-02-04
US20160035864A1
Electricity

Fin end spacer for preventing merger of raised active regions

#8 | 2015-09-24
US20150270365A1
Electricity

Selective dielectric spacer deposition for exposing sidewalls of a finFET

#9 | 2015-09-03
US20150249086A1
Electricity

Third type of metal gate stack for CMOS devices

#10 | 2015-08-18
US14220299
Electricity

Selective dielectric spacer deposition for exposing sidewalls of a finFET

#11 | 2015-07-16
US20150200291A1
Electricity

Fin end spacer for preventing merger of raised active regions

#12 | 2015-02-10
US14071984
Electricity

Formation of functional gate structures with different critical dimensions using a replacement gate process

#13 | 2013-01-17
US20130015580A1
Electricity

Replacement metal gate structure and methods of manufacture

#14 | 2011-12-08
US20110298017A1
Electricity

Replacement gate MOSFET with self-aligned diffusion contact

#15 | 2009-07-02
US20090166770A1
Electricity

METHOD OF FABRICATING GATE ELECTRODE FOR GATE OF MOSFET AND STRUCTURE THEREOF

#16 | 2009-06-11
US20090146223A1
Electricity

PROCESS AND METHOD TO LOWER CONTACT RESISTANCE

#17 | 2008-06-26
US20080150033A1
Electricity

Scalable strained FET device and method of fabricating the same

#18 | 2007-09-13
US20070212861A1
Electricity

LASER SURFACE ANNEALING OF ANTIMONY DOPED AMORPHIZED SEMICONDUCTOR REGION

InventorID:

36894 ⎘