Tak Eun

City:

Gyeonggi-do

Country:

South Korea

Published Applications:

Last publication date:

2010-01-07

Top Assignees for applications by Tak Eun

The entities that hold a legal rights for patent applications filed by inventor Eun Tak:

Tak Eun from Gyeonggi-do, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

Inspection method of circuit substrate

Non-contact type apparatus for testing open and short circuits of a plurality of pattern electrodes formed on a panel

Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same

Non-contact type single side probe structure

InventorID:

3727796 ⎘