Juri Barthel

City:

Erkelenz

Country:

Germany

Published Applications:

Last publication date:

2010-02-11

Top Assignees for applications by Juri Barthel

The entities that hold a legal rights for patent applications filed by inventor Barthel Juri:

Juri Barthel from Erkelenz, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Electron microscope and a method for measuring the defocus variation or the limit resolution

InventorID:

3750450 ⎘