Patrick Blanckaert

City:

Boortmeerbeek

Country:

Belgium

Published Applications:

Last publication date:

2018-05-17

Top Assignees for applications by Patrick Blanckaert

The entities that hold a legal rights for patent applications filed by inventor Blanckaert Patrick:

NIKON METROLOGY N.V. 3 Heverlee, Belgium
NIKON CORPORATION 1 Tokyo, Japan
NIKON METROLOGY NV 1 Leuven, Belgium

Recent patent applications by Blanckaert Patrick

Patrick Blanckaert from Boortmeerbeek, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2018-05-17

US20180135969A1

Physics

SYSTEM FOR MEASURING THE POSITION AND MOVEMENT OF AN OBJECT

#2 | 2015-02-12

US20150043008A1

Physics

Optical scanning probe

#3 | 2014-02-13

US20140043622A1

Physics

SYSTEM FOR MEASURING THE POSITION AND MOVEMENT OF AN OBJECT

#4 | 2013-08-08

US20130202727A1

Performing operations; transporting

Image forming optical system, imaging apparatus, profile measuring apparatus, structure manufacturing system and structure manufacturing method

InventorID:

376652 ⎘