Fishkill, New York
United States
8
2017-01-19
The entities that hold a legal rights for patent applications filed by inventor Sendelbach Matthew J.:
Matthew J. Sendelbach from Fishkill, US has applied for patents for these inventions. The list has both pending applications and granted patents:
HYBRID METROLOGY TECHNIQUE
#2 | 2013-09-19Automated hybrid metrology for semiconductor device fabrication
#3 | 2013-08-08HYBRID METROLOGY FOR SEMICONDUCTOR DEVICES
#4 | 2010-07-29Etching system and method for forming multiple porous semiconductor regions with different optical and structural properties on a single semiconductor wafer
#5 | 2009-07-23Optical measurement using fixed polarizer
#6 | 2008-06-26Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
#7 | 2006-08-17Combining multiple reference measurement collections into a weighted reference measurement collection
#8 | 2005-09-08Assessment and optimization for metrology instrument including uncertainty of total measurement uncertainty
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