Cincinnati, Ohio
United States
11
2010-05-27
The entities that hold a legal rights for patent applications filed by inventor Suh Ui Won:
Ui Won Suh from Cincinnati, US has applied for patents for these inventions. The list has both pending applications and granted patents:
System and method for eddy current inspection of parts with complex geometries
#2 | 2010-04-08Omnidirectional eddy current array probes and methods of use
#3 | 2008-07-03Multi-frequency image processing for inspecting parts having complex geometric shapes
#4 | 2007-10-18Method of aligning probe for eddy current inspection
#5 | 2007-06-21Methods and apparatus for testing a component
#6 | 2006-10-05Method for performing model based scanplan generation of a component under inspection
#7 | 2006-06-22Eddy current probe and inspection method
#8 | 2006-05-25Methods and apparatus for testing a component
#9 | 2006-02-02Methods and apparatus for testing a component
#10 | 2005-07-05Real time laser shock peening quality assurance by natural frequency analysis
#11 | 2005-06-14Eddy current inspection method
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