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Inventor profile of:

Patrick Juncar

City:

Etiolles

Country:

France

Published Applications:

1

Last publication date:

2010-06-17

Top Assignees for applications by Patrick Juncar

The entities that hold a legal rights for patent applications filed by inventor Juncar Patrick:

LABORATOIRE NATIONAL DE METROLOGIE ET D'ESSAIS 1 Paris, France
CONSERVATOIRE NATIONAL DES ARTS ET METIERS 1 Paris, France

Recent patent applications by Juncar Patrick

Patrick Juncar from Etiolles, FR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2010-06-17

US20100149552A1

OPTICAL METROLOGY SYSTEM

InventorID:

3801514 ⎘