Moetzingen
Germany
34
2021-07-15
The entities that hold a legal rights for patent applications filed by inventor Eckert Martin:
Martin Eckert from Moetzingen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:
Device for positioning a semiconductor die in a wafer prober
#2 | 2021-04-29Stressing integrated circuits using a radiation source
#3 | 2021-03-04Integrated circuit with optical tunnel
#4 | 2019-12-26Probe card alignment
#5 | 2019-07-04Content addressable memory with match hit quality indication
#6 | 2019-07-04Adjustable load transmitter
#7 | 2019-05-30Functional testing of high-speed serial links
#8 | 2019-01-17Probe card alignment
#9 | 2019-01-17Probe card alignment
#10 | 2019-01-17Adjustable load transmitter
#11 | 2018-12-04Adjustable load transmitter
#12 | 2018-09-25Adjustable load transmitter
#13 | 2018-09-25Probe card alignment
#14 | 2018-07-19Content addressable memory with match hit quality indication
#15 | 2018-04-19Layout effect characterization for integrated circuits
#16 | 2018-02-27Layout effect characterization for integrated circuits
#17 | 2018-02-13Content addressable memory with match hit quality indication
#18 | 2017-08-22Layout effect characterization for integrated circuits
#19 | 2017-06-08Chip attach frame
#20 | 2017-04-11Determining categories for memory fail conditions
#21 | 2017-03-30RAM at speed flexible timing and setup control
#22 | 2017-03-30RAM at speed flexible timing and setup control
#23 | 2016-10-06Soldering three dimensional integrated circuits
#24 | 2016-07-26Determining categories for memory fail conditions
#25 | 2016-04-07Method for electrical testing of a 3-D chip stack
#26 | 2015-07-16Chip attach frame
#27 | 2015-03-05CHIP ATTACH FRAME
#28 | 2014-10-23Power noise histogram of a computer system
#29 | 2014-10-09System for electrical testing and manufacturing of a 3-D chip stack and method
#30 | 2013-12-26Network power fault detection
#31 | 2013-08-15Chip attach frame
#32 | 2012-05-17Detecting an unstable input to an IC
#33 | 2012-01-19Method and system for performing self-tests in an electronic system
#34 | 2010-06-03Test fail analysis on VLSI chips
384924 ⎘