Sunnyvale, California
United States
24
2009-01-22
The entities that hold a legal rights for patent applications filed by inventor Wan Jun:
Jun Wan from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Word line compensation in non-volatile memory erase operations
#2 | 2008-07-03Retention margin program verification
#3 | 2008-07-03Retention margin program verification
#4 | 2008-06-12Reducing read disturb for non-volatile storage
#5 | 2008-06-12Reducing read disturb for non-volatile storage
#6 | 2008-06-12Reducing read disturb for non-volatile storage
#7 | 2008-01-24Selective program voltage ramp rates in non-volatile memory
#8 | 2007-07-12Trimming of analog voltages in flash memory devices
#9 | 2007-07-12Flash memory devices with trimmed analog voltages
#10 | 2007-07-05System for reducing read disturb for non-volatile storage
#11 | 2007-06-14Reducing read disturb for non-volatile storage
#12 | 2007-06-07System for reducing read disturb for non-volatile storage
#13 | 2007-05-15Last-first mode and method for programming of non-volatile memory with reduced program disturb
#14 | 2007-02-01Method for programming non-volatile memory with self-adjusting maximum program loop
#15 | 2007-02-01System for programming non-volatile memory with self-adjusting maximum program loop
#16 | 2007-01-30Last-first mode and apparatus for programming of non-volatile memory with reduced program disturb
#17 | 2006-12-14Selective application of program inhibit schemes in non-volatile memory
#18 | 2006-06-29Word line compensation in non-volatile memory erase operations
#19 | 2006-06-22Systems for comprehensive erase verification in non-volatile memory
#20 | 2006-05-11Systems for comprehensive erase verification in non-volatile memory
#21 | 2006-05-11Comprehensive erase verification for non-volatile memory
#22 | 2006-05-11Comprehensive erase verification for non-volatile memory
#23 | 2006-04-04System for programming non-volatile memory with self-adjusting maximum program loop
#24 | 2005-12-01Comprehensive erase verification for non-volatile memory
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