David D. Sieloff

City:

Georgetown, Texas

Country:

United States

Published Applications:

Last publication date:

2009-02-05

Top Assignees for applications by David D. Sieloff

The entities that hold a legal rights for patent applications filed by inventor Sieloff David D.:

FREESCALE SEMICONDUCTOR, INC 2 Austin, TX United States

Recent patent applications by Sieloff David D.

David D. Sieloff from Georgetown, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2009-02-05

US20090032704A1

Physics

Method of measuring thin layers using SIMS

#2 | 2006-08-24

US20060188999A1

Physics

Processes for testing a region for an analyte and a process for forming an electronic device

InventorID:

3870965 ⎘