Lee D. Whetsel

Multiplexer selecting STP clock signal with tap control outputs

Clock and mode signals controlling data communication in three states

Parallel scan distributors and collectors and process of testing integrated circuits

Circuitry with multiplexed dedicated and shared scan path cells

Selecting between tap/scan with instructions and lock out signal

Data retaining boundary scan cell

Probeless testing of pad buffers on wafer

IEEE 1149.1 tap instruction scan with augmented TLM scan mode

Comparing on die response and expected response applied to outputs

IC with separate scan paths and shift states

Tap and test controller with separate enable inputs

Means scanning scan path parts sequentially and capturing response simultaneously

IC with scan distributor and scan collector circuitry

IC with external register present lead connected to instruction register

Selecting different 1149.1 TAP domains from update-IR state

IC with TAP, STP and lock out controlled output buffer

IC tap/scan test port access with tap lock circuitry

First and second scan distributors, collectors, controllers, and multiplexers

System with functional and selector circuits connected by mode lead

Testing ICs with distributor, collector, and parallel scan paths

Selecting groups of dies for wafer testing

Hierarchical linking module connection to access ports of embedded cores

Selecting between two TAP circuits with MODE/TCK and TCK/MODE signals

Fault tolerant selection of die on wafer

Quad state logic design methods, circuits, and systems

Method and apparatus for die testing on wafer

Response bits as stimulus in subdivided scan path delay test

Plural circuit selection using role reversing control inputs

Quad state memory with converter feedback, transmission, and clock circuitry

IC with cache bit memory in series with scan segment

Tap with separate scan cell in series with instruction register

JTAG state machines with respective enable input and select input

Means scanning scan path parts sequentially and capturing response simultaneously