Alexander Tokar

City:

Haifa

Country:

Israel

Published Applications:

Last publication date:

2009-03-12

Top Assignees for applications by Alexander Tokar

The entities that hold a legal rights for patent applications filed by inventor Tokar Alexander:

Alexander Tokar from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

X-ray measurement of properties of nano-particles

Inspection of small features using X-ray fluorescence

Detection of dishing and tilting using X-ray fluorescence

InventorID:

3900144 ⎘