Michael Hecker

City:

Reichenberg

Country:

Germany

Published Applications:

Last publication date:

2009-05-07

Top Assignees for applications by Michael Hecker

The entities that hold a legal rights for patent applications filed by inventor Hecker Michael:

Michael Hecker from Reichenberg, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques

InventorID:

3937126 ⎘