Yuri Plotnikov

City:

Niskayuna, New York

Country:

United States

Published Applications:

Last publication date:

2009-05-07

Top Assignees for applications by Yuri Plotnikov

The entities that hold a legal rights for patent applications filed by inventor Plotnikov Yuri:

Yuri Plotnikov from Niskayuna, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Flexible eddy current array probe and methods of assembling the same

Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same

Pulsed eddy current pipeline inspection system and method

InventorID:

3938453 ⎘