Heiko Stegmann

City:

Dresden

Country:

Germany

Published Applications:

Last publication date:

2024-10-17

Top Assignees for applications by Heiko Stegmann

The entities that hold a legal rights for patent applications filed by inventor Stegmann Heiko:

CARL ZEISS MICROSCOPY GMBH 6 Jena, Germany
Carl Zeiss Microscopy Ltd. 1 Cambridge, United Kingdom

Recent patent applications by Stegmann Heiko

Heiko Stegmann from Dresden, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2024-10-17

US20240347312A1

Electricity

DEVICE AND METHOD FOR PREPARING MICROSCOPIC SAMPLES VIA BACKSIDE THINNING

#2 | 2024-06-13

US20240192124A1

Physics

METHODS FOR CREATING A TRENCH IN A SAMPLE, AND COMPUTER PROGRAM PRODUCT

#3 | 2023-08-17

US20230260744A1

Electricity

METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUCT, AND MATERIAL PROCESSING DEVICE FOR CARRYING OUT THE METHOD

#4 | 2023-01-05

US20230003988A1

Physics

Sample holder system with freely settable inclination angles

#5 | 2020-02-27

US20200066483A1

Electricity

Method for processing an object

#6 | 2019-10-03

US20190304743A1

Electricity

Charged particle beam system and method

#7 | 2013-09-12

US20130234011A2

Electricity

METHOD FOR SETTING AN OPERATING PARAMETER OF A PARTICLE BEAM DEVICE AND A SAMPLE HOLDER FOR PERFORMING THE METHOD

#8 | 2013-08-22

US20130213945A1

Physics

Methods and apparatus for the preparation of microscopy samples by using pulsed light

#9 | 2010-09-16

US20100230584A1

Electricity

Method for setting an operating parameter of a particle beam device and a sample holder for performing the method

InventorID:

397015 ⎘