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Inventor profile of:

Choul KWON

City:

Busan

Country:

Korea (South)

Published Applications:

1

Last publication date:

2009-07-16

Recent patent applications by KWON Choul

Choul KWON from Busan, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2009-07-16

US20090180587A1

METHOD OF DETECTING FINE SURFACE DEFECTS

InventorID:

3987895 ⎘