Duli Mao

IMAGE SENSOR PIXEL CELL WITH MULTI-GATE TRANSFER TRANSISTOR

IMAGE SENSOR WITH OPTICAL STRUCTURE FOR FLARE REDUCTION

Optimized pixel design for mitigating MIM image lag

High K metal-insulator-metal (MIM) capacitor network for lag mitigation

Image sensor diagonal isolation structures

Suppressed cross-talk pixel-array substrate and fabrication method

High Dynamic Range, Backside-illuminated, Low Crosstalk Image Sensor with Walls Between Silicon Surface and First Layer Metal to Isolate Photodiodes

CMOS image sensor with LED flickering reduction and low color cross-talk

CMOS image sensor with multiple sensitivities for high dynamic range imaging and led flicker mitigation

Pixel layout with photodiode region partially surrounding circuitry

Flicker-mitigating pixel-array substrate

Fully buried color filter array of image sensor

High dynamic range split pixel CMOS image sensor with low color crosstalk

Image sensor with partially encapsulating attenuation layer

Method and structure to improve image sensor crosstalk

Image sensor with split pixel structure and method of manufacturing thereof

Fully buried color filter array of image sensor

Sensor comprising gate modulation with inductor to form a resonant circuit

Image sensor having a source follower transistor with a multi-thickness gate dielectric

CMOS IMAGE SENSOR WITH MULTIPLE STAGE TRANSFER GATE

Vertical overflow drain combined with vertical transistor

Curved image sensor using thermal plastic substrate material

Pixel array with embedded split pixels for high dynamic range imaging

Resonant-filter image sensor and associated fabrication method

Self-alignment of a pad and ground in an image sensor

Source follower contact

Silicon photosensor array integrated circuit on [110]substrate with deep, anisotropically-etched, trench isolation

Self-alignment of a pad and ground in an image sensor

Self-aligned optical grid on image sensor

Single-exposure high dynamic range sensor

Manufacturing method of image sensor including source follower contact to floating diffusion

Low noise CMOS image sensor by stack architecture

Image sensor with big and small pixels and method of manufacture

Image sensor with two-dimensional split dual photodiode pairs

Methods for high-dynamic-range color imaging

Backside metal grid and metal pad simplification

Through-semiconductor and through-dielectric isolation structure

Graded-semiconductor image sensor

Image sensor with inverted source follower

Systems and methods for active depth imager with background subtract

High-dynamic-range color image sensors and associated methods

CMOS image sensor with dual floating diffusions per pixel for flicker-free detection of light emitting diodes

Apparatus and method for single-photon avalanche-photodiode detectors with reduced dark count rate

Self-aligned optical grid on image sensor

CMOS image sensor with reduced cross talk

Image sensor with hybrid deep trench isolation

Backside metal grid and metal pad simplification

Linear-logarithmic image sensor

Biased deep trench isolation

Image sensor with inverted source follower

Horizontal avalanche photodiode

High dynamic range image sensor with virtual high-low sensitivity pixels

Vertical gate guard ring for single photon avalanche diode pitch minimization

Stacked-chip backside-illuminated SPAD sensor with high fill-factor

Image sensor with big and small pixels and method of manufacture

Resonant-filter image sensor and associated fabrication method

Systems and methods for detecting light-emitting diode without flickering

Graded-semiconductor image sensor

Stacked image sensor

Isolation structure in photodiode

Biased deep trench isolation

Through-semiconductor-via capping layer as etch stop layer

Color filter including diamond-shaped pixels

Curved image sensor

Quantum dot image sensor

CMOS image sensor with peninsular ground contracts and method of manufacturing the same

Hard mask as contact etch stop layer in image sensors

Virtual high dynamic range large-small pixel image sensor

RGB-IR photosensor with nonuniform buried P-well depth profile for reduced cross talk and enhanced infrared sensitivity

Hard mask as contact etch stop layer in image sensors

Image sensor with enhanced quantum efficiency

Storage transistor with optical isolation

Blue enhanced image sensor

Floating diffusion reset level boost in pixel cell

High near infrared sensitivity image sensor

DOPANT CONFIGURATION IN IMAGE SENSOR PIXELS

Conductive trench isolation

Die seal ring for integrated circuit system with stacked device wafers

Image sensor pixel having storage gate implant with gradient profile

Conductive trench isolation

Image sensors for capturing both visible light images and infrared light images, and associated systems and methods

Big-small pixel scheme for image sensors

IMAGE SENSOR AND PIXELS INCLUDING VERTICAL OVERFLOW DRAIN

Color filter including clear pixel and hard mask

Optical shield in a pixel cell planarization layer for black level correction

Dual-facing camera assembly

Image sensor pixel cell with global shutter having narrow spacing between gates

Negatively charged layer to reduce image memory effect

Negatively charged layer to reduce image memory effect

Lateral light shield in backside illuminated imaging sensors

Layers for increasing performance in image sensors

Image sensor pixel cell with global shutter having narrow spacing between gates

HIGH DYNAMIC RANGE PIXEL HAVING A PLURALITY OF PHOTODIODES WITH A SINGLE IMPLANT

Process to eliminate lag in pixels having a plasma-doped pinning layer

High dynamic range pixel having a plurality of amplifier transistors

Image sensor with pixel units having mirrored transistor layout

Circuit structure for providing conversion gain of a pixel array

Color filter including clear pixel and hard mask

Die seal ring for integrated circuit system with stacked device wafers

Negatively charged layer to reduce image memory effect