Williston, Vermont
United States
116
2026-01-22
The entities that hold a legal rights for patent applications filed by inventor Arsovski Igor:
Igor Arsovski from Williston, US has applied for patents for these inventions. The list has both pending applications and granted patents:
COMMUNICATION SCHEDULING BASED ON CROSSTALK DATA
#2 | 2024-09-05PROACTIVE THERMAL MANAGEMENT OF A DETERMINISTIC PROCESSOR TO IMPROVE LATENCY, THROUGHPUT, AND RELIABILITY
#3 | 2024-07-25Power Management of a Power Regulator in a Processor During High Current Events
#4 | 2024-05-30Preemptive Processor Power Supply Regulator Feedback Modulation to Mitigate Voltage Overshoot and Undershoot
#5 | 2023-10-26Optical Communication for Memory Disaggregation in High Performance Computing
#6 | 2021-09-16Multi-sense amplifier based access to a single port of a memory cell
#7 | 2021-04-22Multiple sense amplifier and data path-based pseudo dual port SRAM
#8 | 2021-04-22Customer-transparent logic redundancy for improved yield
#9 | 2021-03-18Sensing circuits for charge trap transistors
#10 | 2021-03-04Multi-port high performance memory
#11 | 2021-02-04Multi-port memory architecture for a systolic array
#12 | 2020-12-03Hermetic barrier for semiconductor device
#13 | 2020-10-22Parallel-prefix adder and method
#14 | 2020-10-08Memory built-in self test error correcting code (MBIST ECC) for low voltage memories
#15 | 2020-10-06Activity-aware supply voltage and bias voltage compensation
#16 | 2020-07-30High-density high-bandwidth static random access memory (SRAM) with phase shifted sequential read
#17 | 2020-05-28Parallel-prefix adder and method
#18 | 2020-05-14Ternary content addressable memory
#19 | 2020-03-05Customer-transparent logic redundancy for improved yield
#20 | 2020-01-16Sequential read mode static random access memory (SRAM)
#21 | 2019-11-14Zero test time memory using background built-in self-test
#22 | 2019-09-26Dynamic power analysis with per-memory instance activity customization
#23 | 2019-05-16Ternary content addressable memory
#24 | 2019-02-28Sense-line muxing scheme
#25 | 2018-10-04Zero test time memory using background built-in self-test
#26 | 2018-05-10Bending circuit for static random access memory (SRAM) self-timer
#27 | 2018-04-19INTERPOSER HEATER FOR HIGH BANDWIDTH MEMORY APPLICATIONS
#28 | 2018-03-13Ternary content addressable memory (TCAM) for multi bit miss detect circuit
#29 | 2018-02-13Transmission system having duplicate transmission systems for individualized precharge and output timing
#30 | 2017-12-28Customer-transparent logic redundancy for improved yield
#31 | 2017-12-21Algorithmic N search/M write ternary content addressable memory (TCAM)
#32 | 2017-12-07Self pre-charging memory circuits
#33 | 2017-11-02Double bandwidth algorithmic memory array
#34 | 2017-10-05Timing/power risk optimized selective voltage binning using non-linear voltage slope
#35 | 2017-09-28Pre-test power-optimized bin reassignment following selective voltage binning
#36 | 2017-08-03Application specific integrated circuit (ASIC) test screens and selection of such screens
#37 | 2017-07-20Environmentally aware mobile computing devices
#38 | 2017-07-13Content-addressable memory having multiple reference matchlines to reduce latency
#39 | 2017-02-28Matchline precharge architecture for self-reference matchline sensing
#40 | 2017-02-09Ternary content addressable memory
#41 | 2016-12-15TCAM structures with reduced power supply noise
#42 | 2016-12-15Composite views for IP blocks in ASIC designs
#43 | 2016-10-27Pre-test power-optimized bin reassignment following selective voltage binning
#44 | 2016-06-16Converting an XY TCAM to a value TCAM
#45 | 2016-06-09Minimization of bias temperature instability (BTI) degradation in circuits
#46 | 2016-05-19Scoped search engine
#47 | 2016-05-12Customer-transparent logic redundancy for improved yield
#48 | 2016-03-01Customer-transparent logic redundancy for improved yield
#49 | 2016-02-02Bias temperature instability state detection and correction
#50 | 2015-11-19High density search engine
#51 | 2015-09-10Learning artificial neural network using ternary content addressable memory (TCAM)
#52 | 2015-08-27Limiting skew between different device types to meet performance requirements of an integrated circuit
#53 | 2015-08-13Stress balancing of circuits
#54 | 2015-07-16Converting an XY TCAM to a value TCAM
#55 | 2015-07-09Single ended sensing circuits for signal lines
#56 | 2015-06-25Partial update in a ternary content addressable memory
#57 | 2015-06-25Partial update in a ternary content addressable memory
#58 | 2015-05-14Leakage reduction in output driver circuits
#59 | 2015-02-26Self-timed, single-ended sense amplifier
#60 | 2015-01-22STATISTICAL POWER ESTIMATION
#61 | 2014-11-06Implementing computational memory from content-addressable memory
#62 | 2014-07-17Determining overall optimal yield point for a semiconductor wafer
#63 | 2014-07-17Methods and circuits for disrupting integrated circuit function
#64 | 2014-07-10Two phase search content addressable memory with power-gated main-search
#65 | 2014-04-24Memory system incorporating a circuit to generate a delay signal and an associated method of operating a memory system
#66 | 2013-12-05Content addressable memory early-predict late-correct single ended sensing
#67 | 2013-11-21Majority dominant power scheme for repeated structures and structures thereof
#68 | 2013-09-12Majority dominant power scheme for repeated structures and structures thereof
#69 | 2013-08-29Vdiff max limiter in SRAMs for improved yield and power
#70 | 2012-06-07Static random access memory (SRAM) write assist circuit with leakage suppression and level control
#71 | 2012-05-31Word-line level shift circuit
#72 | 2012-03-29Methods and systems for adjusting wordline up-level voltage to improve production yield relative to SRAM-cell stability
#73 | 2012-03-29SRAM having wordline up-level voltage adjustable to assist bitcell stability and design structure for same
#74 | 2012-03-01Method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis models
#75 | 2011-04-28Content addressable memory with concurrent read and search/compare operations at the same memory cell
#76 | 2011-04-21SRAM delay circuit that tracks bitcell characteristics
#77 | 2011-04-14Method and apparatus for configuring a content-addressable memory (CAM) design as binary CAM or ternary CAM
#78 | 2011-04-14Word-line level shift circuit
#79 | 2010-12-16Method for low power sensing in a multi-port SRAM using pre-discharged bit lines
#80 | 2010-12-09Low power, single-ended sensing in a multi-port SRAM using pre-discharged bit lines
#81 | 2010-09-09Environmental and computing cost reduction with improved reliability in workload assignment to distributed computing nodes
#82 | 2010-08-12Critical path redundant logic for mitigation of hardware across chip variation
#83 | 2010-02-04Adaptive noise suppression using a noise look-up table
#84 | 2009-12-31Circuit structure and method for digital integrated circuit performance screening
#85 | 2009-12-10Apparatus and method for low power, single-ended sensing in a multi-port SRAM using pre-discharged bit lines
#86 | 2009-12-10Apparatus and method for low power sensing in a multi-port SRAM using pre-discharged bit lines
#87 | 2009-06-04Structure for implementing memory array device with built in computation capability
#88 | 2009-06-04Apparatus and method for implementing memory array device with built in computational capability
#89 | 2009-06-04STRUCTURE FOR IMPLEMENTING ENHANCED CONTENT ADDRESSABLE MEMORY PERFORMANCE CAPABILITY
#90 | 2009-06-04Design structure for implementing matrix-based search capability in content addressable memory devices
#91 | 2009-06-04Content addressable memory with concurrent two-dimensional search capability in both row and column directions
#92 | 2009-06-04Apparatus and method for implementing matrix-based search capability in content addressable memory devices
#93 | 2009-04-30Design structure for a flexible multimode logic element for use in a configurable mixed-logic signal distribution path
#94 | 2009-04-23Transition balancing for noise reduction/Di/Dt reduction during design, synthesis, and physical design
#95 | 2009-04-23SHIFTING INACTIVE CLOCK EDGE FOR NOISE REDUCTION
#96 | 2009-04-16Device Threshold Calibration Through State Dependent Burnin
#97 | 2009-01-22Design structures of powering on integrated circuit
#98 | 2009-01-22Method and systems of powering on integrated circuit
#99 | 2009-01-22Design structures, method and systems of powering on integrated circuit
#100 | 2008-10-16E-FUSE AND METHOD
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