David W. Murray

City:

Windsor, California

Country:

United States

Published Applications:

Last publication date:

2008-06-26

Recent patent applications by Murray David W.

David W. Murray from Windsor, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Method for normalized test line limits with measurement uncertainty

System and method for storing embedded diagnostic test failure reports on a faulty component

Equipment testing system and method having scaleable test line limits

Method and system for performing embedded diagnostic application at subassembly and component level

Measurement and calibration method for embedded diagnostic systems

Development environment and basic tenets for enabling robust embedded diagnostics in RF systems

Apparatus And Method For Performing Failure Diagnostic Testing of Electronic Equipment

InventorID:

4134332 ⎘