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Inventor profile of:

Do-Hoon Byun

City:

Suwon-si

Country:

Korea (South)

Published Applications:

1

Last publication date:

2008-03-20

Recent patent applications by Byun Do-Hoon

Do-Hoon Byun from Suwon-si, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2008-03-20

US20080068036A1

SEMICONDUCTOR TEST SYSTEM CAPABLE OF VIRTUAL TEST AND SEMICONDUCTOR TEST METHOD THEREOF

InventorID:

4140737 ⎘