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Inventor profile of:

Jun Zhai

City:

Sunnyvale, California

Country:

United States

Published Applications:

1

Last publication date:

2008-05-01

Recent patent applications by Zhai Jun

Jun Zhai from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2008-05-01

US20080102637A1

Method and semiconductor structure for reliability characterization

InventorID:

4166643 ⎘