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Inventor profile of:

Toru Tojo

City:

Tokyo

Country:

Japan

Published Applications:

2

Last publication date:

2008-05-29

Recent patent applications by Tojo Toru

Toru Tojo from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2008-05-29

US20080121799A1

SAMPLE ANALYZING APPARATUS

#2 | 2006-10-26

US20060239535A1

Pattern defect inspection method and apparatus

InventorID:

4181102 ⎘