Yonkers, New York
United States
16
2017-10-19
The entities that hold a legal rights for patent applications filed by inventor Singhee Amith:
Amith Singhee from Yonkers, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Unifying realtime and static data for presenting over a web service
#2 | 2016-01-21Electric outage detection and localization
#3 | 2015-06-25CIRCUIT TECHNIQUE TO ELECTRICALLY CHARACTERIZE BLOCK MASK SHIFTS
#4 | 2014-06-19Analysis of chip-mean variation and independent intra-die variation for chip yield determination
#5 | 2014-06-19ANALYSIS OF CHIP-MEAN VARIATION AND INDEPENDENT INTRA-DIE VARIATION FOR CHIP YIELD DETERMINATION
#6 | 2013-12-05Circuit technique to electrically characterize block mask shifts
#7 | 2013-08-29Dynamically determining number of simulations required for characterizing intra-circuit incongruent variations
#8 | 2013-08-13Performance driven layout optimization using morphing of a basis set of representative layouts
#9 | 2012-12-27Pareto sampling using simplicial refinement by derivative pursuit
#10 | 2012-12-06Spatial correlation-based estimation of yield of integrated circuits
#11 | 2012-10-16Method and apparatus for rapidly modeling and simulating intra-die statistical variations in integrated circuits using compressed parameter models
#12 | 2012-03-15Detecting dose and focus variations during photolithography
#13 | 2011-12-15Pareto sampling using simplicial refinement by derivative pursuit
#14 | 2011-11-24LAYOUT QUALITY EVALUATION
#15 | 2011-09-08Spatial correlation-based estimation of yield of integrated circuits
#16 | 2011-07-14Circuit-level validation of computer executable device/circuit simulators
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