Fishkill, New York
United States
10
2008-10-30
The entities that hold a legal rights for patent applications filed by inventor Demarest James J.:
James J. Demarest from Fishkill, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Non-destructive, below-surface defect rendering using image intensity analysis
#2 | 2008-10-16Structure to improve adhesion between top CVD low-K dielectric and dielectric capping layer
#3 | 2008-06-05Electrical programmable metal resistor
#4 | 2007-11-22Post chemical mechanical polishing etch for improved time dependent dielectric breakdown reliability
#5 | 2007-07-12Method to improve time dependent dielectric breakdown
#6 | 2007-06-28Structure to improve adhesion between top CVD low-k dielectric and dielectric capping layer
#7 | 2006-11-16Method of forming interconnect structure or interconnect and via structures using post chemical mechanical polishing
#8 | 2006-11-09Electrical programmable metal resistor
#9 | 2006-05-11NANOSCALE DEFECT IMAGE DETECTION FOR SEMICONDUCTORS
#10 | 2005-10-20Structure to improve adhesion between top CVD low-k dielectric and dielectric capping layer
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