Inventor profile of:

Yuko Tachimura

City:

Kanagawa

Country:

Japan

Published Applications:

16

Last publication date:

2014-05-15

Top Assignees for applications by Yuko Tachimura

The entities that hold a legal rights for patent applications filed by inventor Tachimura Yuko:

Recent patent applications by Tachimura Yuko

Yuko Tachimura from Kanagawa, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2014-05-15
US20140134771A1
Electricity

Light emitting device and method for manufacturing the same

#2 | 2009-04-02
US20090087930A1
Physics

Inspection system, inspection method, and method for manufacturing semiconductor device

#3 | 2008-09-18
US20080224831A1
Electricity

Product management system

#4 | 2008-07-15
US10820810
-

Display device, and vehicle-mounted display device and electronic

#5 | 2008-06-26
US20080149731A1
Electricity

ID label, ID card, and ID tag

#6 | 2008-02-19
US10801135
-

Thin film integrated circuit device

#7 | 2008-01-31
US20080024156A1
Physics

Inspection method for semiconductor device

#8 | 2007-11-29
US20070273476A1
Physics

Thin Semiconductor Device And Operation Method Of Thin Semiconductor Device

#9 | 2007-07-19
US20070164413A1
Electricity

Semiconductor device with antenna and separating layer

#10 | 2007-07-12
US20070159353A1
Electricity

Film-like article and method for manufacturing the same

#11 | 2007-07-12
US20070159335A1
Electricity

Semiconductor device

#12 | 2007-05-31
US20070120471A1
Electricity

Display device and method for fabricating the same

#13 | 2007-01-25
US20070019032A1
Electricity

Method for forming wiring, method for manufacturing thin film transistor and droplet discharging method

#14 | 2007-01-18
US20070013397A1
Physics

Inspection system, inspection method, and method for manufacturing semiconductor device

#15 | 2006-07-27
US20060163597A1
Electricity

High contrast light emitting device and method for manufacturing the same

#16 | 2005-08-04
US20050168235A1
Physics

Inspection system, inspection method, and method for manufacturing semiconductor device

InventorID:

4201565 ⎘