Mark S. Williams

City:

Austin, Texas

Country:

United States

Published Applications:

Last publication date:

2008-08-14

Top Assignees for applications by Mark S. Williams

The entities that hold a legal rights for patent applications filed by inventor Williams Mark S.:

Mark S. Williams from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Parallel-beam scanning for surface patterning of materials

Discrete curve symmetry detection

Parallel-beam scanning for surface patterning of materials

InventorID:

4231071 ⎘