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Inventor profile of:

Xiaolei WANG

City:

Beijing

Country:

China

Published Applications:

Last publication date:

2026-06-11

Top Assignees for applications by Xiaolei WANG

The entities that hold a legal rights for patent applications filed by inventor WANG Xiaolei:

Institute of Microelectronics. Chinese Academy of Sciences 9 Beijing, China
National Institute of Metrology 2 Beijing, China
PEKING UNIVERSITY FOUNDER GROUP CO., LTD. 2 Beijing, China
BOE TECHNOLOGY GROUP CO., LTD. 2 Beijing, China
BEIJING FOUNDER APABI TECHNOLOGY LTD. 2 Beijing, China
Xiaomi Inc. 1 Beijing, China
INSTITUE OF MICROELELCTRONICS, CHINESE ACADEMY OF SCINECES 1 BEIJING, China
FOUNDER INFORMATION INDUSTRY HOLDINGS CO., LTD. 1 Beijing, China
HEFEI BOE DISPLAY LIGHT CO., LTD. 1 Hefei, Anhui, China
HITACHI, LTD. 1 Tokyo, Japan
HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD. 1 Hefei, Anhui, China

Recent patent applications by WANG Xiaolei

Xiaolei WANG from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-11

US20260164634A1

Electricity

VERTICAL CHANNEL SRAM CELL, METHOD OF MANUFACTURING VERTICAL CHANNEL SRAM CELL, MEMORY, AND ELECTRONIC DEVICE

#2 | 2026-06-04

US20260156904A1

Electricity

METHOD OF REPAIRING INTEGRATED CIRCUIT

#3 | 2026-05-07

US20260130138A1

Electricity

METHOD FOR MANUFACTURING OXIDE LAYER AND SEMICONDUCTOR DEVICE

#4 | 2026-04-16

US20260107571A1

Electricity

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

#5 | 2025-09-25

US20250301617A1

Electricity

SRAM CELL, METHOD OF MANUFACTURING SRAM CELL, MEMORY INCLUDING SRAM CELL AND ELECTRONIC DEVICE

#6 | 2021-04-29

US20210125873A1

Electricity

SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF

#7 | 2019-03-21

US20190086255A1

Physics

High accuracy measuring device for measuring large mass

#8 | 2018-11-22

US20180335337A1

Physics

Measuring device for measuring large mass with optical refraction and displacement measuring

#9 | 2018-10-11

US20180294342A1

Electricity

Transistor having a gate with a variable work function and method for manufacturing the same

#10 | 2016-06-09

US20160161523A1

Physics

Airflow test method, airflow test apparatus and clean room control system

#11 | 2016-04-28

US20160116142A1

Mechanical engineering

Press fixture

#12 | 2014-10-23

US20140317494A1

Physics

Method and device for updating electronic document and associated document use records

#13 | 2014-10-02

US20140297792A1

Electricity

Server, data caching method, and communication system

#14 | 2014-01-16

US20140015063A1

Electricity

Method for forming gate structure, method for forming semiconductor device, and semiconductor device

#15 | 2014-01-16

US20140015062A1

Electricity

Method for Forming Gate Structure, Method for Forming Semiconductor Device, and Semiconductor Device

#16 | 2013-12-19

US20130335424A1

Physics

CHARACTER DISPLAY METHOD AND DEVICE

#17 | 2013-09-05

US20130232110A1

Physics

METHOD AND APPARATUS FOR SAVING A DOCUMENT

#18 | 2012-10-18

US20120261761A1

Electricity

Semiconductor device and method of manufacturing the same

#19 | 2012-01-26

US20120021596A1

Electricity

Method of manufacturing a semiconductor device

#20 | 2012-01-19

US20120012939A1

Electricity

Semiconductor device and method of manufacturing the same

#21 | 2011-10-27

US20110260255A1

Electricity

Semiconductor device and method of manufacturing the same

#22 | 2011-10-20

US20110254093A1

Electricity

Semiconductor device and method of manufacturing the same

#23 | 2011-10-20

US20110254063A1

Electricity

SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

#24 | 2011-09-22

US20110227163A1

Electricity

SEMICONDUCTOR DEVICE

InventorID:

426928 ⎘