Inventor profile of:

Helmut Hagleitner

City:

Zebulon, North Carolina

Country:

United States

Published Applications:

34

Last publication date:

2017-03-16

Top Assignees for applications by Helmut Hagleitner

The entities that hold a legal rights for patent applications filed by inventor Hagleitner Helmut:

Recent patent applications by Hagleitner Helmut

Helmut Hagleitner from Zebulon, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2017-03-16
US20170077254A1
Electricity

Ohmic contact structure for group III nitride semiconductor device having improved surface morphology and well-defined edge features

#2 | 2017-01-12
US20170012106A1
Electricity

Method of forming vias in silicon carbide and resulting devices and circuits

#3 | 2016-04-21
US20160111503A1
Electricity

Semiconductor device with improved field plate

#4 | 2016-04-21
US20160111502A1
Electricity

Semiconductor device with improved field plate

#5 | 2015-12-17
US20150364569A1
Electricity

Gate contact for a semiconductor device and methods of fabrication thereof

#6 | 2015-05-21
US20150140806A1
Electricity

Wafer-level die attach metallization

#7 | 2014-09-18
US20140264960A1
Electricity

Encapsulation of advanced devices using novel PECVD and ALD schemes

#8 | 2014-09-18
US20140264868A1
Electricity

Wafer-level die attach metallization

#9 | 2014-09-18
US20140264713A1
Electricity

Gate contact for a semiconductor device and methods of fabrication thereof

#10 | 2014-06-26
US20140175664A1
Electricity

Dielectric solder barrier for semiconductor devices

#11 | 2014-05-08
US20140124792A1
Electricity

Ni-rich Schottky contact

#12 | 2014-04-17
US20140103363A1
Electricity

Using stress reduction barrier sub-layers in a semiconductor die

#13 | 2014-04-10
US20140097469A1
Electricity

Hydrogen mitigation schemes in the passivation of advanced devices

#14 | 2013-10-03
US20130256841A1
Electricity

Polymer via plugs with high thermal integrity

#15 | 2013-09-12
US20130234278A1
Electricity

Schottky contact

#16 | 2012-07-12
US20120175682A1
Electricity

Ohmic contact to semiconductor device

#17 | 2012-06-07
US20120139084A1
Electricity

Ohmic contact structure for group III nitride semiconductor device having improved surface morphology and well-defined edge features

#18 | 2012-05-10
US20120115319A1
Electricity

Contact pad

#19 | 2011-11-17
US20110278590A1
Electricity

Semiconductor devices having gates including oxidized nickel

#20 | 2011-11-03
US20110266557A1
Electricity

Semiconductor devices having improved adhesion and methods of fabricating the same

#21 | 2011-09-22
US20110227089A1
Electricity

Multilayer diffusion barriers for wide bandgap Schottky barrier devices

#22 | 2011-08-11
US20110193135A1
Electricity

Methods of forming contact structures including alternating metal and silicon layers and related devices

#23 | 2011-07-07
US20110165771A1
Electricity

Method of forming vias in silicon carbide and resulting devices and circuits

#24 | 2011-05-12
US20110108855A1
Electricity

Method of forming vias in silicon carbide and resulting devices and circuits

#25 | 2009-08-27
US20090215280A1
Electricity

Passivation of wide band-gap based semiconductor devices with hydrogen-free sputtered nitrides

#26 | 2009-04-23
US20090104738A1
Electricity

Method of forming vias in silicon carbide and resulting devices and circuits

#27 | 2008-08-21
US20080197360A1
Electricity

Diode having reduced on-resistance and associated method of manufacture

#28 | 2008-05-22
US20080116464A1
Electricity

Silicon-rich nickel-silicide ohmic contacts for SiC semiconductor devices

#29 | 2008-02-21
US20080042145A1
Electricity

DIFFUSION BARRIER FOR LIGHT EMITTING DIODES

#30 | 2007-01-04
US20070001174A1
Electricity

Passivation of wide band-gap based semiconductor devices with hydrogen-free sputtered nitrides

#31 | 2006-03-30
US20060065910A1
Electricity

Method of forming vias in silicon carbide and resulting devices and circuits

#32 | 2006-02-14
US10382826
-

Methods of fabricating high voltage, high temperature capacitor and interconnection structures

#33 | 2006-01-12
US20060006393A1
Electricity

Silicon-rich nickel-silicide ohmic contacts for SiC semiconductor devices

#34 | 2005-12-06
US9878442
-

High voltage, high temperature capacitor and interconnection structures

InventorID:

429949 ⎘