Ran Vered

City:

Nechalim

Country:

Israel

Published Applications:

Last publication date:

2007-02-01

Top Assignees for applications by Ran Vered

The entities that hold a legal rights for patent applications filed by inventor Vered Ran:

Ran Vered from Nechalim, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system

InventorID:

4344713 ⎘