Eindhoven
Netherlands
14
2023-02-02
The entities that hold a legal rights for patent applications filed by inventor Freitag Bert Henning:
Bert Henning Freitag from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#2 | 2022-12-29Charged particle microscope scan masking for three-dimensional reconstruction
#3 | 2022-09-29Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging
#4 | 2021-12-28System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy
#5 | 2019-11-07EELS detection technique in an electron microscope
#6 | 2019-03-05Transmission charged particle microscope with imaging beam rotation
#7 | 2014-10-30Mounting structures for multi-detector electron microscopes
#8 | 2014-03-20X-ray Detector for Electron Microscope
#9 | 2013-09-19X-ray detector for electron microscope
#10 | 2012-01-19Contrast for scanning confocal electron microscope
#11 | 2011-11-17Simultaneous electron detection
#12 | 2011-01-13Method for inspecting a sample
#13 | 2010-02-11Method of machining a work piece with a focused particle beam
#14 | 2007-03-01Method for determining lens errors in a particle-optical device
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