Inventor profile of:

Ming HE

City:

Slingerlands, New York

Country:

United States

Published Applications:

16

Last publication date:

2016-06-30

Top Assignees for applications by Ming HE

The entities that hold a legal rights for patent applications filed by inventor HE Ming:

Recent patent applications by HE Ming

Ming HE from Slingerlands, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-06-30
US20160190207A1
Electricity

Integrated circuits including magnetic tunnel junctions for magnetoresistive random-access memory and methods for fabricating the same

#2 | 2016-04-28
US20160118292A1
Electricity

Methods of producing integrated circuits with an air gap

#3 | 2015-08-13
US20150228585A1
Electricity

SELF-FORMING BARRIER INTEGRATED WITH SELF-ALIGNED CAP

#4 | 2015-03-26
US20150087149A1
Electricity

Methods for fabricating integrated circuits using improved masks

#5 | 2014-12-11
US20140361435A1
Electricity

Copper based nitride liner passivation layers for conductive copper structures

#6 | 2014-12-04
US20140353835A1
Electricity

Methods of self-forming barrier integration with pore stuffed ULK material

#7 | 2014-12-04
US20140353805A1
Electricity

METHODS OF SEMICONDUCTOR CONTAMINANT REMOVAL USING SUPERCRITICAL FLUID

#8 | 2014-12-04
US20140353802A1
Electricity

Methods for integration of pore stuffing material

#9 | 2014-09-11
US20140252616A1
Electricity

Electroless fill of trench in semiconductor structure

#10 | 2014-08-07
US20140217588A1
Electricity

Methods of forming copper-based nitride liner/passivation layers for conductive copper structures and the resulting device

#11 | 2014-06-17
US13757288
-

Methods of forming conductive copper-based structures using a copper-based nitride seed layer without a barrier layer and the resulting device

#12 | 2014-05-29
US20140145332A1
Electricity

METHODS OF FORMING GRAPHENE LINERS AND/OR CAP LAYERS ON COPPER-BASED CONDUCTIVE STRUCTURES

#13 | 2014-02-27
US20140057435A1
Electricity

METHODS OF FORMING A METAL CAP LAYER ON COPPER-BASED CONDUCTIVE STRUCTURES ON AN INTEGRATED CIRCUIT DEVICE

#14 | 2013-11-21
US20130309863A1
Electricity

Methods of forming copper-based conductive structures by forming a copper-based seed layer having an as-deposited thickness profile and thereafter performing an etching process and electroless copper deposition

#15 | 2013-11-19
US13533816
-

Methods for fabricating integrated circuits with ruthenium-lined copper

#16 | 2013-09-19
US20130244421A1
Electricity

Methods of forming copper-based conductive structures on an integrated circuit device

InventorID:

444831 ⎘